High resolution electron imaging system for sub-micron sized metastable atom beams produced by Stern-Gerlach interferometry

Measurement Science and Technology

Volumn 16, Issue 10, 2005, Pages 1997-2004

  Milosavljevic A R ^a   Bocvarski V ^a   Jureta, J ^a   Marinkovic B P ^a   Karam, J C ^b   Grucker, J ^b   Perales, F ^b   Vassilev, G ^b   Reinhardt, J ^b   Robert, J ^b   Baudon, J ^b  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b Centrale de Proximité en Nanotechnologies de Paris Nord   (France)

Author keywords

Atom interferometry; Electron imaging; Electron lenses

Indexed keywords

ATOMIC BEAMS; DETECTORS; ELECTRODES; ELECTRON LENSES; INTERFEROMETRY; OPTICAL RESOLVING POWER;

ATOM INTERFEROMETRY; CHROMATIC ABERATIONS; ELECTRON IMAGING; MAGNETIC GRADIENTS;

IMAGING TECHNIQUES;

INTERFEROMETRY; MEASUREMENT METHOD;

EID: 25644440708     PISSN: 09570233     EISSN: 09570233     Source Type: Journal    
DOI: 10.1088/0957-0233/16/10/015     Document Type: Article

References (19)

1. Boustimi M, Bočvarski V, Viaris de Lesegno B, Brodsky K, Perales F, Baudon J and Robert J 2000 Phys. Rev. A 61 33602
2. Viaris de Lesegno B et al 2003 Eur. Phys. J. D 23 25 and references therein
3. Rubin K, Eminyan M, Perales F, Mathevet R, Brodsky K, Viaris de Lesegno B, Reinhardt J, Boustimi M, Baudon J and Robert J 2004 Laser Phys. Lett. 1 184
4. Kurtsiefer Ch and Mlynek J 1997 Appl. Phys. B 64 85
5. Schneble D, Hasuo M, Anker T, Pfau T and Mlynek J 2003 Rev. Sci. Instrum. 74 2685
6. Dahl D A 1995 SIMION 3D VERSION 6.0, User's Manual
7. Milosavljević A R, Bočvarski V, Marinković B P, Perales F, Robert J, Baudon J and Karam J-C 2004 Proc. 22nd Int. Symp. on Physics of Ionized Gases-SPIG'2004 (National Park Tara, Bajina Bašta) (Belgrade: Vinča Institute of Nuclear Sciences) p 101
8. Milosavljević A R, Bočvarski V, Marinković B P, Perales F, Robert J, Baudon J and Karam J-C 2004 Proc. 8th EPS Conf. on Atomic and Molecular Physics-ECAMP8 (Rennes, France) vol 28F, part II (Milhouse: European Physical Society) p 8
9. Bauer E 1985 Ultramicroscopy 17 51
10. Bonini N and Brivio G P 2003 Phys. Rev. B 68 035408
11. Sesselmann W, Woratschek B, Kuppers J, Ertl G and Haberland H 1987 Phys. Rev. B 35 1547
12. Hagstrum H D 1954 Phys. Rev. 96 336
13. Sesselmann W, Conrad H, Ertl G, Kuppers J, Woratschek B and Haberland H 1983 Phys. Rev. Lett. 50 446
14. Bozso F, Yates J T, Arias J Jr, Metiu H and Martin R M 1983 J. Chem. Phys. 78 4256
15. Conrad H, Ertl G, Kuppers J, Sesselmann W and Haberland H 1982 Surface Sci. 121 161
16. Conrad H, Ertl G, Kuppers J and Wang S W 1979 Phys. Rev. Lett. 42 1082
17. Martinez G, Sancho M and Read F H 1983 J. Phys. E: Sci. Instrum. 16 631
18. Grivet P 1972 Electron Optics 2nd English edn (Oxford: Pergamon)
19. Rempfer G F 1985 J. Appl. Phys. 57 2385