Leakage current based stabilization scheme for robust sense-amplifier design for yield enhancement in nano-scale SRAM

Proceedings of the Asian Test Symposium

Volumn 2005, Issue , 2005, Pages 176-181

  Mukhopadhyay, Saibal ^a   Raychowdhury, Arijit ^a   Mahmoodi, Hamid ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; COMPUTER SYSTEM RECOVERY; LEAKAGE CURRENTS; NANOSTRUCTURED MATERIALS; STABILIZATION; STORAGE ALLOCATION (COMPUTER);

ACCESS FAILURE; LEAKAGE CURRENT BASED STABILIZATION SCHEME; SENSE-AMPLIFIERS;

STATIC RANDOM ACCESS STORAGE;

EID: 33846910535     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2005.73     Document Type: Conference Paper

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