The unacceptable variability in tunnel currents for proposed electronic device applications

Semiconductor Science and Technology

Volumn 21, Issue 12, 2006, Pages

  Kelly, Michael J ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRONIC EQUIPMENT; SEMICONDUCTOR DEVICE MANUFACTURE;

DEVICE PERFORMANCE; TUNNEL BARRIERS; TUNNEL CURRENTS;

TUNNEL DIODES;

EID: 33846879189     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/12/L01     Document Type: Article

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