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Volumn 1, Issue 11, 2006, Pages 25-39

In situ observation by AFM of the morphology of copper metallization during electrodeposition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; ELECTRODEPOSITION; ELECTRODES; METALLIZING; POLYCRYSTALLINE MATERIALS;

EID: 33846783234     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2218475     Document Type: Conference Paper
Times cited : (4)

References (25)
  • 9
    • 0032655743 scopus 로고    scopus 로고
    • M. Cerisier, C. Van Haesendonck, and J.-P. Cells, J. Electrochem. Soc., 146, 1829 (1999)
    • M. Cerisier, C. Van Haesendonck, and J.-P. Cells, J. Electrochem. Soc., 146, 1829 (1999)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.