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Volumn 137, Issue , 2006, Pages 265-271
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Sensing thermal conductivity and structural effects at the nanoscale by scanning thermal microscopy (SThM)
a b a a c b b |
Author keywords
[No Author keywords available]
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Indexed keywords
AUSTENITE;
DIAMONDS;
ION BEAMS;
MARTENSITE;
MICROSTRUCTURE;
NANOSTRUCTURED MATERIALS;
NICKEL;
PHASE TRANSITIONS;
PROBES;
SHAPE MEMORY EFFECT;
THERMAL CONDUCTIVITY;
DIAMOND CRYSTALLITES;
FOCUSED ION BEAM IMPLANTATION;
SCANNING THERMAL MICROSCOPY;
WOLLASTON PROBE;
LOW PASS FILTERS;
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EID: 33846634604
PISSN: 11554339
EISSN: 17647177
Source Type: Conference Proceeding
DOI: 10.1051/jp4:2006137053 Document Type: Conference Paper |
Times cited : (7)
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References (11)
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