Sensitivity of ac scanning thermal microscopy to thermophysical parameters

Journal De Physique. IV : JP

Volumn 125, Issue , 2005, Pages 83-85

  Chirtoc, M ^a   Filip, X ^b   Henry, J F ^a   Antoniow, J S ^a   Pelzl, J ^c  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

^c RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; INSULATING MATERIALS; SCANNING; SENSITIVITY ANALYSIS; THERMAL CONDUCTIVITY; THERMODYNAMIC PROPERTIES;

AC SCANNING THERMAL MICROSCOPY; CROSSOVER FREQUENCY; STHM SIGNAL; WOLLASTON THERMAL PROBE;

OPTICAL MICROSCOPY;

EID: 33645065857     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2005125019     Document Type: Conference Paper

References (4)

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4. F. Depasse, Ph. Grossel and S. Gomes, J. Phys. D: Appl. Phys. 36 (2003) 204-210.