메뉴 건너뛰기




Volumn 2005, Issue , 2005, Pages 79-86

A software test program generator for verifying system-on-chips

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); COMPUTER PROGRAMMING; FEEDBACK; MICROPROCESSOR CHIPS; SOFTWARE ENGINEERING;

EID: 33846626857     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2005.1568818     Document Type: Conference Paper
Times cited : (17)

References (12)
  • 2
    • 4544246585 scopus 로고    scopus 로고
    • Coverage measurement for software application level verification using symbolic trajectory evaluation techniques
    • Perth, Australia: IEEE Computer Society
    • A. Cheng, A. Parashkevov, and C.C. Lim, "Coverage measurement for software application level verification using symbolic trajectory evaluation techniques," in 2nd IEEE International Workshop on Electronic Design, Test & Applications (DELTA'2004). Perth, Australia: IEEE Computer Society, 2004, pp. 237-242.
    • (2004) 2nd IEEE International Workshop on Electronic Design, Test & Applications (DELTA'2004) , pp. 237-242
    • Cheng, A.1    Parashkevov, A.2    Lim, C.C.3
  • 4
    • 17444396138 scopus 로고    scopus 로고
    • A survey of HW/SW cosimulation techniques and tools
    • Internal Report, Vetenskap Och Konst Royal Institute of Technology. Stockholm, Sweden, 48 p
    • H. Hubert, "A survey of HW/SW cosimulation techniques and tools," Internal Report, Vetenskap Och Konst Royal Institute of Technology. Stockholm, Sweden, 1998, 48 p.
    • (1998)
    • Hubert, H.1
  • 8
    • 0032306939 scopus 로고    scopus 로고
    • Native mode functional test generation for processors with applications to self-test and design validation
    • Washington, DC, USA
    • J. Shen and J. A. Abraham, "Native mode functional test generation for processors with applications to self-test and design validation," in International Test Conference. Washington, DC, USA, 1998, pp. 990-999.
    • (1998) International Test Conference , pp. 990-999
    • Shen, J.1    Abraham, J.A.2
  • 10
    • 84949798789 scopus 로고    scopus 로고
    • Evolutionary test program induction for microprocessor design verification
    • F. Corno, G. Cumani, M. S. Reorda, and G. Squillero, "Evolutionary test program induction for microprocessor design verification," in 11th Asian Test Symposium, 2002, pp. 368-373.
    • (2002) 11th Asian Test Symposium , pp. 368-373
    • Corno, F.1    Cumani, G.2    Reorda, M.S.3    Squillero, G.4
  • 12
    • 33846641326 scopus 로고    scopus 로고
    • Altera Inc. Nios Hardware Development Tutorial, ver 1.0, 2003, 54 P
    • Altera Inc. "Nios Hardware Development Tutorial," ver 1.0, 2003, 54 P.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.