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Electronics Letters

Volumn 43, Issue 2, 2007, Pages 129-130

Reduction of leakage current of 4H-SiC pin diodes after UV light exposure

(3) Wolborski, M a Bakowski, M b Schoner A b

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

b ACREO AB (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CLEANING; DIODES; LIGHT; SILICON CARBIDE; SURFACE TREATMENT;

CARBON CLUSTERS;

LEAKAGE CURRENTS;

EID: 33846564507 PISSN: 00135194 EISSN: None Source Type: Journal
DOI: 10.1049/el:20073494 Document Type: Article

Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.