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Zeitschrift fur Kristallographie, Supplement

Volumn 1, Issue 23, 2006, Pages 141-146

Diffuse X-ray scattering from GaN/SiC (0001) thin films

(2) Danis S a Holy V a

a CHARLES UNIVERSITY (Czech Republic)

Author keywords

Diffuse x ray scattering; Dislocation density; Gallium nitride; Thin films

Indexed keywords

EID: 33846433707 PISSN: 0930486X EISSN: None Source Type: Journal
DOI: 10.1524/zksu.2006.suppl_23.141 Document Type: Conference Paper

Times cited : (1)

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