Non-contact subsurface defects characterization by microwave and millimeter wave techniques

Sensing and Imaging

Volumn 7, Issue 4, 2006, Pages 125-154

  Maazi, M ^a   Benzaim, O ^a   Haddadi, K ^a   Glay, D ^a   Lasri, Tuami ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

Artificial neural network; Defect; Microwave; Millimeter wave; Non destructive characterization

Indexed keywords

COMPUTER SIMULATION; DEFECTS; DIELECTRIC MATERIALS; MICROWAVES; MILLIMETER WAVES; NEURAL NETWORKS;

FREQUENCY BAND; NON-DESTRUCTIVE CHARACTERIZATION; VECTOR NETWORK ANALYZER;

NONDESTRUCTIVE EXAMINATION;

EID: 33846320102     PISSN: 15572064     EISSN: 15739317     Source Type: Journal    
DOI: 10.1007/s11220-006-0026-3     Document Type: Article

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