Application of imaging systems to characterization of single-event effects in high-energy neutron environments

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3718-3725

  Torok Z ^a,b   Platt, S P ^a,b  

^a IEEE   (United Kingdom)

^b UNIVERSITY OF CENTRAL LANCASHIRE   (United Kingdom)

Author keywords

Charge coupled devices; Charge measurement; Dosimetry; Image analysis; Neutron beams; Neutron effects; Test facilities

Indexed keywords

CHARGE MEASUREMENT; NEUTRON EFFECTS;

CHARGE COUPLED DEVICES; COMPUTER SOFTWARE; FACILITIES; IMAGE ANALYSIS; NEUTRONS; PARTICLE ACCELERATORS;

IMAGING SYSTEMS;

EID: 33846294350     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.885005     Document Type: Conference Paper

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