Degradation of organic light-emitting diodes under different environment at high drive conditions

Organic Electronics

Volumn 8, Issue 1, 2007, Pages 37-43

  Gardonio, S ^a   Gregoratti, L ^a   Melpignano, P ^b   Aballe, L ^a   Biondo, V ^b   Zamboni, R ^c   Murgia, M ^c   Caria, S ^c   Kiskinova, M ^a  

^a SINCROTRONE TRIESTE   (Italy)

^b Centro Ricerche Plast Optica   (Italy)

^c CNR   (Italy)

Author keywords

Degradation process; Light emitting diodes; Surfaces microscopy; X ray photoelectron spectra in surface analysis

Indexed keywords

FILM GROWTH; INDIUM COMPOUNDS; SEMICONDUCTING ORGANIC COMPOUNDS; STRUCTURE (COMPOSITION); THIN FILMS; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

DEGRADATION PROCESS; MICROAREAS; SURFACE ANALYSIS; SURFACES MICROSCOPY;

LIGHT EMITTING DIODES;

EID: 33846257269     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2006.10.005     Document Type: Article

References (23)

1. Tang C.W., and VanSlyke S.A. Appl. Phys. Lett. 51 (1987) 913
2. Hepp A., Heil H., Weise W., Ahles M., Schmechel R., and von Seggern H. Phys. Rev. Lett. 91 (2003) 157406
3. Cicoira F., Santato C., Dinelli F., Murgia M., Loi M.A., Biscarini F., Zamboni R., Heremans P., and Muccini M. Adv. Funct. Mater. 15 (2005) 375
4. Nakanotani H., Sasabe H., and Adachi C. Appl. Phys. Lett. 86 (2005) 213506
5. Organic Light Emitting Diodes for General Illumination Update 2002, Optoelectronics Industry Development Association, 1133 Connecticut Avenue, NW#600, Washington, DC 20036.
6. Farchioni R., and Grosso G. Organic Electronics Materials (2001), Springer
7. Aziz H., and Popovic Z.D. Chem. Mater. 16 (2004) 4522
8. Xu M.S., Xu J.B., Chen H.Z., and Wang M. J. Phys. D: Appl. Phys. 37 (2004) 2618
9. Schaer M., Nüesch F., Berner D., Leo W., and Zuppiroli L. Adv. Funct. Mater. 11 (2001) 116
10. Geffroy B., le Roy P., and Prat C. Polym. Int. 55 (2006) 572 and references therein
11. Melpignano P., Baron-Toaldo A., Biondo V., Priante S., Zamboni R., Murgia M., Caria S., Gregoratti L., Barinov A., and Kiskinova M. Appl. Phys. Lett. 86 (2005) 41105
12. Marsi M., Casalis L., Gregoratti L., Günther S., Kolomakov A., Kovac J., Lonza D., and Kiskinova M. J. Electron. Spectrosc. Rel. Phenom. 84 (1997) 73
13. Gunther S., Kaulich B., Gregoratti L., and Kiskinova M. Prog. Surf. Sci. 70 (2002) 187
14. Gunther S., Kolmakov A., Kovac J., and Kiskinova M. Ultramicroscopy 75 (1998) 35
15. Doniach S., and Sunjic M. J. Phys. C 3 (1970) 285
16. Yamaquchi M., Ide-Ektessabi A., Nomura H., and Yasui N. Thin Solid Films 447 (2004) 115
17. Kim Y.-S., Park Y.-C., Ansari S.G., Lee B.-S., and Shin H.-S. Thin Solid Film 426 (2003) 124
18. Ishida T., Kobayashi H., and Nakato Y. J. Appl. Phys. 73 (1993) 4344
19. Yeh J.J. Atomic Calculation of Photoionization Cross-Sections and Asymmetry Parameters (1993), Gordon and Breach Science Publishers, Langhorne, PE
20. Christou V., Etchells M., Renault O., Dobson P.J., Salata O.V., Beamson G., and Egdell R.G. J. Appl. Phys. 88 (2000) 5180
21. NIST XPS Principle Photoelectron lines, http://srdata.nist.gov/xps.
22. Liao L.S., He J., Zhou X., Lu M., Xiong Z.H., Deng Z.B., Hou X.Y., and Lee S.T. J. Appl. Phys. 88 (2000) 2386
23. Kolosov D., English D.S., Bulovic V., Barbara P.F., Forrest S.R., and Thompson M.E. J. Appl. Phys. 90 (2001) 3242