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Volumn 53, Issue 12, 2006, Pages 2261-2269

Advanced fabrication and characterization of epitaxial ferroelectric thin films and multilayers

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CREEP; EPITAXIAL GROWTH; MULTILAYERS; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR SUPERLATTICES; SURFACE ROUGHNESS;

EID: 33846231758     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2006.171     Document Type: Article
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.