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Volumn 61, Issue , 2004, Pages 143-148

Investigation of ferroelectricity in ultrathin PbTiO3 films

Author keywords

Ferroelectricity; Oxide epitaxial growth; Ultrathin perovskite films

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; FERROELECTRICITY; LATTICE CONSTANTS; LEAD COMPOUNDS; MAGNETRON SPUTTERING; PEROVSKITE;

EID: 18044365746     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580490459062     Document Type: Article
Times cited : (8)

References (13)
  • 8
    • 0037417284 scopus 로고    scopus 로고
    • Critical thickness for ferroclectricity in perovskite ultrathin films
    • Junquera Javier and Ghosez Philippe, "Critical thickness for ferroclectricity in perovskite ultrathin films," Nature 422, 506 (2003).
    • (2003) Nature , vol.422 , pp. 506
    • Javier, J.1    Philippe, G.2
  • 12
    • 0025536442 scopus 로고
    • X-ray photoelectron and auger electron forward scattering: A new tool for surface crystallography
    • F. Egelhoff William Jr., "X-ray photoelectron and auger electron forward scattering: a new tool for surface crystallography," Critical Reviews in Solide State and Materials Sciences 16(3), 213 (1990).
    • (1990) Critical Reviews in Solide State and Materials Sciences , vol.16 , Issue.3 , pp. 213
    • William Jr., F.E.1
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.