Production Deployment of a Fast Transient Testing Methodology for Analog Circuits: Case Study and Results

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 1174-1181

  Voorakaranam, Ram ^a,e   Newby, Randy ^b   Cherubal, Sasi ^a   Cometta, Bob ^b   Kuehl, Thomas ^b   Majernik, David ^c   Chatterjee, Abhijit ^d  

^a Ardext Technologies   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c Arctic Systems Inc   (United States)

^d GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^e AMKOR TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; INTEGRATED CIRCUITS; OPTIMIZATION;

FAST TRANSIENT TESTING (FASTEST);

INTEGRATED CIRCUIT TESTING;

EID: 0142184731     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. P.N. Variyam, S. Cherubal and A. Chatterjee, "Prediction of Analog Performance Parameters Using Fast Transient Testing", IEEE Transactions on Computer-Aided Design of Integrated Circuits, Vol. 21, No. 3, March 2002, pp. 349-361.
2. R. Voorakaranam and A. Chatterjee, "Test generation for accurate prediction of analog specifications," Proceedings, VLSI Test Symposium, 2000, pp. 137-142.
3. R. Voorakaranam and A. Chatterjee, "A Signature Test Framework for Rapid Production Testing of RF Circuits," Design, Automation and Test in Europe, 2002, pp. 186-191.
4. M. Burns and G. W. Roberts, An Introduction to Mixed-Signal IC Test and Measurement, Oxford University Press, New York, 2001, pp. 68-74.