TCAD modeling of strain-engineered MOSFETs

Materials Research Society Symposium Proceedings

Volumn 913, Issue , 2006, Pages 167-178

  Lee, Smith ^a  

^a SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRANSPORT; CIRCUIT CHARACTERISTICS; MSFET CHANNELS; OFF-STATE LEAKAGES;

CARRIER MOBILITY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; MATHEMATICAL MODELS; STANDBY POWER SYSTEMS; STRAIN CONTROL;

MOSFET DEVICES;

EID: 33846104532     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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