Instrumentation design for gate and drain low frequency noise measurements

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2006, Pages 1747-1750

  Giusi, G ^a   Crupi, F ^b   Ciofi, C ^a   Pace, C ^b  

^a UNIVERSITY OF MESSINA   (Italy)

^b UNIVERSITY OF CALABRIA   (Italy)

Author keywords

CMOS devices; Drain noise; Gate noise; Low frequency noise; Low noise amplifiers

Indexed keywords

LOW NOISE AMPLIFIERS; SPURIOUS SIGNAL NOISE;

DRAIN NOISE; GATE NOISE; LOW FREQUENCY NOISE;

CMOS INTEGRATED CIRCUITS;

EID: 33846097898     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.235200     Document Type: Conference Paper

References (8)

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8. G. Giusi, F. Crupi, C. Pace, C. Ciofi, G. Groeseneken, "A Comparative Study of Drain and Gate Low Frequency Noise in nMOSFETs with Hafnium Based Gate Dielectrics", IEEE Trans. on Electron Devices, Vol.53, n.4, April 2006