The performance of temperature - Sensitive for VOx thin film resistances deposited on PS substrate

Cailiao Yanjiu Xuebao/Chinese Journal of Materials Research

Volumn 20, Issue 5, 2006, Pages 496-498

  Dou, Yanwei ^a   Hu, Ming ^a   Cui, Meng ^a   Zong, Yang ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Inorganic non metallic materials; Porous silicon; Thermal isolation; VOx thin film

Indexed keywords

CONDUCTIVE FILMS; ELECTRIC RESISTANCE; POROSITY; THERMAL CONDUCTIVITY; VANADIUM COMPOUNDS;

ELECTROCHEMICAL METHOD; RESISTANCE SENSITIVITY; THERMAL ISOLATION; VANADIUM OXIDE THIN FILM;

POROUS SILICON;

EID: 33846052856     PISSN: 10053093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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