ElastIC: An adaptive self-healing architecture for unpredictable silicon

IEEE Design and Test of Computers

Volumn 23, Issue 6, 2006, Pages 484-490

  Sylvester, Dennis ^a   Blaauw, David ^a   Karl, Eric ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Adaptivity; Architecture; ElastIC; Process variations; Runtime self diagnosis; Self healing; Technology scaling; Unpredictable silicon

Indexed keywords

CMOS INTEGRATED CIRCUITS; DESIGN FOR TESTABILITY; SILICON; TECHNOLOGY;

ADAPTIVE SELF-HEALING ARCHITECTURE; PROCESS VARIATION; TECHNOLOGY SCALING;

COMPUTER ARCHITECTURE;

EID: 33846044638     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2006.145     Document Type: Article

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