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Volumn 136, Issue 2-3, 2007, Pages 187-192

Structural characterization of chemically deposited PbS thin films

Author keywords

Diffraction; Ion beam; Semiconductors; Sulfides; Surface morphology; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFRACTION; FILM GROWTH; GRAIN SIZE AND SHAPE; ION BEAMS; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; POLYVINYL ALCOHOLS; SEMICONDUCTING LEAD COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33845971949     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.09.029     Document Type: Article
Times cited : (17)

References (34)
  • 30
    • 85165450949 scopus 로고    scopus 로고
    • W. Rasband, National Institute of Health, USA (http://rsb.info.nih.gov/ij).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.