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Volumn 120, Issue 1-2, 1997, Pages 51-57

Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples

Author keywords

Atomic force microscopy, AFM; Force modulation, FM; Glass; Lateral force microscopy, LFM; PbS; Successive ionic layer adsorption and reaction, SILAR; Thin films

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; ELASTICITY; FRICTION; GLASS; SEMICONDUCTOR GROWTH; SUBSTRATES; THIN FILMS;

EID: 0031270354     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00217-1     Document Type: Article
Times cited : (40)

References (21)
  • 4
    • 0346706694 scopus 로고    scopus 로고
    • US Patent 4675207 (1987)
    • Y.F. Nicolau, US Patent 4675207 (1987).
    • Nicolau, Y.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.