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Volumn 89, Issue 25, 2006, Pages

Universal approach to accurate resistivity measurement for a single nanowire: Theory and application

c NONE

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRES; NONRECTIFYING CONTACTS; TWO-CONTACT METHOD;

ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC WIRE; OHMIC CONTACTS; SYSTEMATIC ERRORS;

NANOSTRUCTURED MATERIALS;

EID: 33845936789 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2405400 Document Type: Article

Times cited : (41)

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