Reduced surface sidewall recombination and diffusion in quantum-dot lasers

IEEE Photonics Technology Letters

Volumn 18, Issue 17, 2006, Pages 1861-1863

  Moore, Stephen A ^b   O'Faolain, Liam ^b   Cataluna, Maria Ana ^a,b,c   Flynn, Michael B ^b   Kotlyar, Maria V ^b   Krauss, Thomas F ^b  

^a Portuguese Science and Technology Foundation   (Portugal)

^b UNIVERSITY OF ST ANDREWS   (United Kingdom)

^c INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Diffusion length; Low threshold; Quantum dot lasers; Surface recombination

Indexed keywords

CARRIER CONFINEMENTS; DIFFUSION LENGTH; LOW THRESHOLD; LOW THRESHOLDS; QUANTUM DOTS; SURFACE RECOMBINATION VELOCITIES; SURFACE RECOMBINATIONS; THRESHOLD CURRENTS;

DIFFUSION; LASERS; QUANTUM WELL LASERS; SEMICONDUCTOR QUANTUM DOTS; SURFACES;

QUANTUM DOT LASERS;

EID: 33845800023     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2006.881206     Document Type: Article

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