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Volumn 215, Issue 1, 2004, Pages 92-99

A system for acquiring simultaneous electron energy-loss and X-ray spectrum-images

Author keywords

EELS mapping; Electron probe microanalysis; X ray mapping

Indexed keywords

DATA ACQUISITION; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON PROBE MICROANALYSIS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; MAPPING;

EID: 3042598670     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01342.x     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.