Stereoscopic depth-detection for handling and manipulation tasks in a scanning electron microscope

Proceedings - IEEE International Conference on Robotics and Automation

Volumn 2006, Issue , 2006, Pages 908-913

  Jähnisch, Marco ^a   Schiffner, Marc ^b  

^a OFFIS INSTITUTE FOR INFORMATION TECHNOLOGY   (Germany)

^b UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Contrast invariance; Gabor; Nanohandling; Scanning Electron Microscope (SEM); Stereo

Indexed keywords

ALGORITHMS; INFORMATION ANALYSIS; NANOTECHNOLOGY; PROBLEM SOLVING; SCANNING ELECTRON MICROSCOPY;

CONTRAST INVARIANCE; DISPARITY MAP; GABOR; NANOHANDLING;

COMPUTER VISION;

EID: 33845599179     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ROBOT.2006.1641825     Document Type: Conference Paper

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