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Volumn 2006, Issue , 2006, Pages 1336-1342

Accurate assessment of packaging stress effects on MEMS devices

Author keywords

Finite element analysis (FEA); MEMS; MEMS sensor package PCB interaction (MPPI); Offset; Plastic package; Stress; Warpage

Indexed keywords

ACCELEROMETERS; COMPUTER SIMULATION; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MICROSENSORS; STRESSES;

EID: 33845575113     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2006.1645500     Document Type: Conference Paper
Times cited : (6)

References (10)
  • 8
    • 0742301748 scopus 로고    scopus 로고
    • Warpage in plastic packages: Effects of process conditions, geometry and materials
    • July
    • J. W. Y. Kong, J. K. Kim, M. F. Yuen, "Warpage in plastic packages: effects of process conditions, geometry and materials," IEEE Transactions on Electronics Packaging Manufacturing, Vol.26, No.3, July 2003 pp.245 - 252.
    • (2003) IEEE Transactions on Electronics Packaging Manufacturing , vol.26 , Issue.3 , pp. 245-252
    • Kong, J.W.Y.1    Kim, J.K.2    Yuen, M.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.