-
1
-
-
0020868461
-
Stress analysis of passivation film crack for plastic molded LSI caused by thermal stress
-
S. Okikawa, M. Sakimoto, M. Tanaka, T. Sato, T. Toya, and Y. Hara, "Stress analysis of passivation film crack for plastic molded LSI caused by thermal stress," in Proc. Int. Symp. Testing and Failure Analysis, 1983, pp. 275-280.
-
(1983)
Proc. Int. Symp. Testing and Failure Analysis
, pp. 275-280
-
-
Okikawa, S.1
Sakimoto, M.2
Tanaka, M.3
Sato, T.4
Toya, T.5
Hara, Y.6
-
2
-
-
0023560046
-
Life estimation for IC plastic packages under temperature cycling based on fracture mechanics
-
Dec.
-
A. Nishimura et al., "Life estimation for IC plastic packages under temperature cycling based on fracture mechanics," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. CHMT-12, no. 4, pp. 637-642, Dec. 1987.
-
(1987)
IEEE Trans. Comp., Hybrids, Manufact. Technol.
, vol.CHMT-12
, Issue.4
, pp. 637-642
-
-
Nishimura, A.1
-
3
-
-
0023734232
-
Finite element analysis of compliant coatings
-
F. Shoraka, C. A. Gealer, and E. Bettez, "Finite element analysis of compliant coatings," in Proc. 38th Electronic Component Conference, 1988, pp. 461-467.
-
(1988)
Proc. 38th Electronic Component Conference
, pp. 461-467
-
-
Shoraka, F.1
Gealer, C.A.2
Bettez, E.3
-
4
-
-
0023565397
-
New profile of ultra low stress resin encapsulants for large chip semiconductor devices
-
Y. Nakamura et al., "New profile of ultra low stress resin encapsulants for large chip semiconductor devices," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. CHMT-12, no. 4, pp. 502-506, 1987.
-
(1987)
IEEE Trans. Comp., Hybrids, Manufact. Technol.
, vol.CHMT-12
, Issue.4
, pp. 502-506
-
-
Nakamura, Y.1
-
5
-
-
0024888870
-
Strain gauge mapping of die surface stresses
-
S. A. Gee et al., "Strain gauge mapping of die surface stresses," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. 12, no. 4, pp. 587-593, 1989.
-
(1989)
IEEE Trans. Comp., Hybrids, Manufact. Technol.
, vol.12
, Issue.4
, pp. 587-593
-
-
Gee, S.A.1
-
6
-
-
0020878106
-
The quality of die attachment and its relationship to stresses and vertical die cracking
-
Dec.
-
C. G. M van Kessel, S. Gee, and J. Murphy, "The quality of die attachment and its relationship to stresses and vertical die cracking," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. CHMT-6, no. 4, pp. 414-420, Dec. 1983.
-
(1983)
IEEE Trans. Comp., Hybrids, Manufact. Technol.
, vol.CHMT-6
, Issue.4
, pp. 414-420
-
-
Van Kessel, C.G.M.1
Gee, S.2
Murphy, J.3
-
8
-
-
0027294572
-
An assessment of mechanical reliability of a die bonded chip package during chip encapsulation and accelerated thermal cycling
-
K. Ramakrishna, J. C. Lo, and Y. Guo, "An assessment of mechanical reliability of a die bonded chip package during chip encapsulation and accelerated thermal cycling," in Proc. 43rd IEEE ECTC, 1993, pp. 670-678.
-
(1993)
Proc. 43rd IEEE ECTC
, pp. 670-678
-
-
Ramakrishna, K.1
Lo, J.C.2
Guo, Y.3
-
9
-
-
0027657615
-
Predicted bow of plastic packages of integrated circuit (IC) devices
-
E. Suhir, "Predicted bow of plastic packages of integrated circuit (IC) devices," J. Reinforced Plastics & Composites, vol. 12 pp. 952-972, 1993.
-
(1993)
J. Reinforced Plastics & Composites
, vol.12
, pp. 952-972
-
-
Suhir, E.1
-
10
-
-
0027961270
-
Accurate prediction of PQFP warpage
-
G. Kelly et al., "Accurate prediction of PQFP warpage," in Proc. 44th ECTC, 1994, pp. 102-106.
-
(1994)
Proc. 44th ECTC
, pp. 102-106
-
-
Kelly, G.1
-
11
-
-
0011260794
-
Package and molding compound mechanics
-
F. Shoraka, K. Kinsman, B. Natarajan, and C. Gealer, "Package and molding compound mechanics," in Proc. 6th Annu. Int. Electronics Packaging Conf., 1986, pp. 294-312.
-
(1986)
Proc. 6th Annu. Int. Electronics Packaging Conf.
, pp. 294-312
-
-
Shoraka, F.1
Kinsman, K.2
Natarajan, B.3
Gealer, C.4
|