메뉴 건너뛰기




Volumn 19, Issue 2, 1996, Pages 296-299

Importance of molding compound chemical shrinkage in the stress and warpage analysis of PQFP's

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); COMPUTER SIMULATION; ELECTRONICS PACKAGING; ENCAPSULATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS; SENSITIVITY ANALYSIS; SHEET MOLDING COMPOUNDS; SHRINKAGE; STRESSES; THERMAL EXPANSION;

EID: 0030142086     PISSN: 10709894     EISSN: None     Source Type: Journal    
DOI: 10.1109/96.496032     Document Type: Article
Times cited : (72)

References (11)
  • 2
    • 0023560046 scopus 로고
    • Life estimation for IC plastic packages under temperature cycling based on fracture mechanics
    • Dec.
    • A. Nishimura et al., "Life estimation for IC plastic packages under temperature cycling based on fracture mechanics," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. CHMT-12, no. 4, pp. 637-642, Dec. 1987.
    • (1987) IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol.CHMT-12 , Issue.4 , pp. 637-642
    • Nishimura, A.1
  • 4
    • 0023565397 scopus 로고
    • New profile of ultra low stress resin encapsulants for large chip semiconductor devices
    • Y. Nakamura et al., "New profile of ultra low stress resin encapsulants for large chip semiconductor devices," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. CHMT-12, no. 4, pp. 502-506, 1987.
    • (1987) IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol.CHMT-12 , Issue.4 , pp. 502-506
    • Nakamura, Y.1
  • 5
    • 0024888870 scopus 로고
    • Strain gauge mapping of die surface stresses
    • S. A. Gee et al., "Strain gauge mapping of die surface stresses," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. 12, no. 4, pp. 587-593, 1989.
    • (1989) IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol.12 , Issue.4 , pp. 587-593
    • Gee, S.A.1
  • 6
    • 0020878106 scopus 로고
    • The quality of die attachment and its relationship to stresses and vertical die cracking
    • Dec.
    • C. G. M van Kessel, S. Gee, and J. Murphy, "The quality of die attachment and its relationship to stresses and vertical die cracking," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. CHMT-6, no. 4, pp. 414-420, Dec. 1983.
    • (1983) IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol.CHMT-6 , Issue.4 , pp. 414-420
    • Van Kessel, C.G.M.1    Gee, S.2    Murphy, J.3
  • 8
    • 0027294572 scopus 로고
    • An assessment of mechanical reliability of a die bonded chip package during chip encapsulation and accelerated thermal cycling
    • K. Ramakrishna, J. C. Lo, and Y. Guo, "An assessment of mechanical reliability of a die bonded chip package during chip encapsulation and accelerated thermal cycling," in Proc. 43rd IEEE ECTC, 1993, pp. 670-678.
    • (1993) Proc. 43rd IEEE ECTC , pp. 670-678
    • Ramakrishna, K.1    Lo, J.C.2    Guo, Y.3
  • 9
    • 0027657615 scopus 로고
    • Predicted bow of plastic packages of integrated circuit (IC) devices
    • E. Suhir, "Predicted bow of plastic packages of integrated circuit (IC) devices," J. Reinforced Plastics & Composites, vol. 12 pp. 952-972, 1993.
    • (1993) J. Reinforced Plastics & Composites , vol.12 , pp. 952-972
    • Suhir, E.1
  • 10
    • 0027961270 scopus 로고
    • Accurate prediction of PQFP warpage
    • G. Kelly et al., "Accurate prediction of PQFP warpage," in Proc. 44th ECTC, 1994, pp. 102-106.
    • (1994) Proc. 44th ECTC , pp. 102-106
    • Kelly, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.