On-chip evaluation, compensation, and storage of scan diagnosis data - A test time efficient scan diagnosis architecture

Proceedings - Eleventh IEEE European Test Symposium, ETS 2006

Volumn 2006, Issue , 2006, Pages 239-244

  Poehl, Frank ^a   Rzeha, Jan ^b   Beck, Matthias ^a   Goessel, Michael ^b   Arnold, Ralf ^a   Ossimitz, Peter ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; DATA REDUCTION; DEFECTS; PRODUCTION CONTROL;

SCAN DIAGNOSIS DATA; SYSTEMATIC PRODUCTION DEFECTS;

DATA STORAGE EQUIPMENT;

EID: 33845395526     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2006.34     Document Type: Conference Paper

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