Three-dimensional investigations of electrical barriers using electron beam induced current measurements

Journal of Applied Physics

Volumn 91, Issue 5, 2002, Pages 2713-2724

  Gaevski, Mikhail ^a   Elfwing, Mattias ^a   Olsson, Eva ^a   Kvist, Anders ^b  

^a UPPSALA UNIVERSITY   (Sweden)

^b Microscopy and Microanalysis Experimental Physics   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845383442     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1432124     Document Type: Article

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