Effect of voltage bias on the EBIC contrast present at varistor grain boundaries

Interface Science

Volumn 8, Issue 4, 2000, Pages 375-387

  Leach, C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; BISMUTH; DOPING (ADDITIVES); ELECTRIC CHARGE; ELECTRIC POTENTIAL; ELECTRON BEAMS; SCANNING ELECTRON MICROSCOPY; VARISTORS; ZINC OXIDE;

ELECTRICAL ACTIVITY; ELECTROCERAMIC; ELECTRON BEAM INDUCED CURRENT CONTRAST; VARISTOR GRAIN BOUNDARIES; VOLTAGE BIAS;

GRAIN BOUNDARIES;

EID: 0034290063     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008783813055     Document Type: Article

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