The remote electron beam-induced current analysis of grain boundaries in semiconducting and semi-insulating materials

Scanning

Volumn 22, Issue 1, 2000, Pages 28-51

  Holt, D B ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Electrical properties; Electron beam induced current; Grain boundaries; Remote electron beam induced current; Semi insulators

Indexed keywords

BARIUM COMPOUNDS; CERAMIC MATERIALS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ENERGY GAP; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON;

REMOTE ELECTRON BEAM-INDUCED CURRENT (REBIC) ANALYSIS;

GRAIN BOUNDARIES;

GERMANIUM; SILICON; TITANIUM DIOXIDE; ZINC OXIDE;

CERAMICS; CONFERENCE PAPER; CONTRAST; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT; ELECTRIC RESISTANCE; ELECTRON BEAM; GRAIN; MATERIALS TESTING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR;

EID: 0034117709     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950220106     Document Type: Conference Paper

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