Grain boundary SEM conductive mode contrast effects in additive free zinc oxide ceramics

Acta Materialia

Volumn 44, Issue 6, 1996, Pages 2431-2436

  Russell, J D ^a   Halls, D C ^b   Leach, C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRON BEAMS; GRAIN BOUNDARIES; IMAGING TECHNIQUES; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINTERING; ZINC OXIDE;

ADDITIVE FREE ZINC OXIDE CERAMICS; CONDUCTIVE MODE CONTRAST; REMOTE ELECTRON BEAM INDUCED CURRENT MODE; RESISTIVE BARRIER EFFECT;

CERAMIC MATERIALS;

EID: 0030173435     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/1359-6454(95)00348-7     Document Type: Article

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