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Volumn 458, Issue 1, 2006, Pages 199-206

Chip-on-glass bonding using sn bump and non-conductive adhesive for LCD application

Author keywords

Chip on glass (COG); Non conductive adhesive (NCA); Sn bump; Thermal cycling

Indexed keywords

ADHESIVES; ELECTRIC RESISTANCE; GLASS BONDING; SILICON; THERMAL CYCLING; THERMAL EFFECTS;

EID: 33845333848     PISSN: 15421406     EISSN: 15635287     Source Type: Journal    
DOI: 10.1080/15421400600932363     Document Type: Conference Paper
Times cited : (3)

References (12)
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  • 2
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  • 3
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    • Overview of conductive adhesive interconnection technologies for LCDs
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    • Kristiansen, H.1    Liu, J.2
  • 5
    • 0036681534 scopus 로고    scopus 로고
    • Effects of bonding parameters on the reliability performance of anisotropic conductive adhesive interconnects for flip-chip-on-flex packages assembly II. Different bonding pressure
    • Chan, Y. C. & Luk, D. Y. (2002). Effects of bonding parameters on the reliability performance of anisotropic conductive adhesive interconnects for flip-chip-on-flex packages assembly II. Different bonding pressure. Microelectron. Reliab., 42(18), 1195-1204.
    • (2002) Microelectron. Reliab. , vol.42 , Issue.18 , pp. 1195-1204
    • Chan, Y.C.1    Luk, D.Y.2
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    • Wojciechowski, D., Vanfleteren, J., Reese, E., & Hagedorn, H.-W. (2000). Electroconductive adhesives for high density package and flip-chip interconnections. Microelectron. Reliab., 40, 1215-1226.
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    • Wojciechowski, D.1    Vanfleteren, J.2    Reese, E.3    Hagedorn, H.-W.4
  • 9
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    • The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications
    • Yin, C. Y., Alam, M. O., Chan, Y. C., Bailey, C., & Lu, H. (2003). The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications. Microelectron. Reliab., 43, 625-633.
    • (2003) Microelectron. Reliab. , vol.43 , pp. 625-633
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  • 10
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    • Effect of Bismuth on the growth kinetics of intermetallic compounds in Sn-3.5Ag solder joints: A growth kinetic model
    • Huh, J.-Y., Han, S.-U., & Park, C.-Y. (2004). Effect of Bismuth on the growth kinetics of intermetallic compounds in Sn-3.5Ag solder joints: A growth kinetic model. Met. Mater-Int., 70(2), 123-132.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.