Structural characterization of shock-affected sapphire

Applied Physics A: Materials Science and Processing

Volumn 86, Issue 2, 2007, Pages 197-200

  Mazilu, M ^a   Juodkazis, S ^b   Ebisui, T ^c   Matsuo, S ^c   Misawa, H ^b  

^a UNIVERSITY OF ST ANDREWS   (United Kingdom)

^b HOKKAIDO UNIVERSITY   (Japan)

^c UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DISLOCATIONS (CRYSTALS); ETCHING; IMAGE PROCESSING; SHOCK WAVES; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE PHASE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SHOCK WAVE PROPAGATION;

SAPPHIRE;

EID: 33845330283     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-006-3732-8     Document Type: Article

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