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Volumn 118, Issue , 2006, Pages 93-127

Band structure and high-pressure measurements

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[No Author keywords available]

Indexed keywords


EID: 33845242724     PISSN: 03424111     EISSN: 15561534     Source Type: Book Series    
DOI: 10.1007/1-84628-209-8_2     Document Type: Article
Times cited : (5)

References (61)
  • 4
    • 77957047253 scopus 로고
    • in Ed RK Willardson and AC Beer (Academic, New York)
    • E. O. Kane, in Semiconductors and semimetals, Vol 1 p75, Ed RK Willardson and AC Beer (Academic, New York, 1966)
    • (1966) Semiconductors and Semimetals , vol.1 , pp. 75
    • Kane, E.O.1
  • 9
    • 77957065871 scopus 로고
    • in Ed RK Willardson and AC Beer (Academic, New York)
    • M.H. Weiler in Semiconductors and semimetals, Vol 16, p119, Ed RK Willardson and AC Beer (Academic, New York, 1981)
    • (1981) Semiconductors and Semimetals , vol.16 , pp. 119
    • Weiler, M.H.1
  • 39
    • 33845250477 scopus 로고    scopus 로고
    • Andreev, unpublished
    • Andreev, unpublished
  • 61
    • 33845243607 scopus 로고    scopus 로고
    • to be published
    • K. O'Brien et al., to be published.
    • O'Brien, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.