Force measurement by AFM cantilever with different coating layers

Key Engineering Materials

Volumn 326-328 I, Issue , 2006, Pages 377-380

  Yeh, Meng Kao ^a   Chen, Bo Yi ^a   Tai, Nyan Hwa ^a   Chiu, Chien Chao ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Atomic force microscopy; Coating layers; Finite element method; Spring constant

Indexed keywords

ATOMIC FORCE MICROSCOPY; FINITE ELEMENT METHOD; NANOSTRUCTURED MATERIALS; NUMERICAL METHODS; PROTECTIVE COATINGS; THICKNESS MEASUREMENT;

CANTILEVERS; COATING LAYERS; SIGNAL INTENSITY; SPRING CONSTANT;

FORCE MEASUREMENT;

EID: 33751530070     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-415-4.377     Document Type: Conference Paper

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