Structural characterization of thin films based on II-VI ternary compounds deposited by evaporation

Thin Solid Films

Volumn 484, Issue 1-2, 2005, Pages 352-357

  Gordillo, G ^a   Romero, E ^a  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

II VI semiconductors; Structural modeling; Vacuum deposition; X ray diffraction

Indexed keywords

CHARACTERIZATION; COMPOSITION; CRYSTAL LATTICES; DEPOSITION; EVAPORATION; SEMICONDUCTOR MATERIALS; VACUUM; X RAY DIFFRACTION;

II-VI SEMICONDUCTORS; LATTICE MATCHING; STRUCTURAL MODELING; VACUUM DEPOSITION;

THIN FILMS;

EID: 19944381558     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.02.021     Document Type: Article

References (16)

1. K. Ramanathan, M. Contreras, I. Perkins, S. Asher, S. Hasoon, J. Keane, D. Young, M. Romero, W. Metzger, R. Noufi, J. Ward, and A. Duda Prog. Photovolt.: Research and Applications 11 2003 225
2. H.S. Ullal, K. Zweibel, and B. Von Roedern Proc. 29th IEEE PVSC, New Orleans 2002 472
3. D. Lincot, R. Ortega-Borges, J. Vedel, M. Ruckh, J. Kesler, K.O. Velthaus, D. Harriskos, and H.W. Schock Proc. 11th EC Photovoltaic Solar Energy Conf 1992 870
4. C. Ferekides, S. Marinskiy, V. Palekis, and D.L. Morel Proc. 2nd World Conf. On PVSEC, Vienna 1998 1085
5. Y. Ohtake, A. Yamada, and M. Konagi Jpn. J. Appl. Phys. 37 1998 3220
6. Y. Ohtake, T. Okamoto, A. Yamada, M. Konagai, and K. Saito Sol. Energy Mater. Sol. Cells 49 1997 269
7. R. Dhere, X. Wu, D. Albin, C. Perkins, H. Moutinho, and T. Gessert Proc. 29th IEEE PVSC, New Orleans 2002 484
8. G. Gordillo, C. Calderón, and F. Rojas Rev. Mex. Fis. 49 4 2003 329
9. G. Gordillo, F. Rojas, and C. Calderón Superficies y Vacio 16 3 2003 30
10. R. Swanepoel J. Phys. E:Sci. Instrum. 16 1983 1214
11. A. Fischer, X. Deng, D. Grecu, K. Makhratchev, X. Ma, R. Wendt, D. Zuo, A.D. Compaan, and R.G. Bohn Proc. 26th IEEE PVSC, Anaheim 1997 447
12. L. Vegard Z. Phys. 5 17 1921
13. D.S. Albin, J.R. Tuttle, G.D. Mooney, J.J. Carapella, A. Duda, A. Mason, and R. Noufi Proc. 21th IEEE PVSC 1990 562
14. M. Konagai, Y. Ohtake, and T. Okamoto Mater. Res. Soc. Symp. Proc. 426 1996 153
15. R.H. Bube, and K.W. Mitchell J. Electron. Mater. 22 1993 17
16. JCPDS Data Base, Intern. Center for Diffrac. Data, Swarthmore, USA, 1996.