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Volumn 203-204, Issue , 2003, Pages 547-550
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Characterization of polymer solar cells by TOF-SIMS depth profiling
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Author keywords
Conjugated polymers; Depth profiles; Depth resolution; Dynamic TOF SIMS; Fullerenes; Solar cells
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DIFFUSION;
FULLERENES;
IMPURITIES;
ORGANIC POLYMERS;
PROFILOMETRY;
SCANNING ELECTRON MICROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
SURFACE ROUGHNESS;
THIN FILMS;
DEPTH PROFILING;
SOLAR CELLS;
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EID: 12244280781
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(02)00756-0 Document Type: Conference Paper |
Times cited : (155)
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References (3)
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