Characterization of polymer solar cells by TOF-SIMS depth profiling

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 547-550

  Bulle Lieuwma, C W T ^a   Van Gennip, W J H ^b   Van Duren, J K J ^b   Jonkheijm, P ^b   Janssen, R A J ^b   Niemantsverdriet, J W ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Conjugated polymers; Depth profiles; Depth resolution; Dynamic TOF SIMS; Fullerenes; Solar cells

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFUSION; FULLERENES; IMPURITIES; ORGANIC POLYMERS; PROFILOMETRY; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACE ROUGHNESS; THIN FILMS;

DEPTH PROFILING;

SOLAR CELLS;

EID: 12244280781     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00756-0     Document Type: Conference Paper

References (3)

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3. de Jong M.P., van Ijzendoorn L.J., de Voigt M.J.A. Appl. Phys. Lett. 77:2000;2255-2257.