메뉴 건너뛰기




Volumn 203-204, Issue , 2003, Pages 547-550

Characterization of polymer solar cells by TOF-SIMS depth profiling

Author keywords

Conjugated polymers; Depth profiles; Depth resolution; Dynamic TOF SIMS; Fullerenes; Solar cells

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFUSION; FULLERENES; IMPURITIES; ORGANIC POLYMERS; PROFILOMETRY; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACE ROUGHNESS; THIN FILMS;

EID: 12244280781     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00756-0     Document Type: Conference Paper
Times cited : (155)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.