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Volumn 2005, Issue , 2005, Pages 173-176

The 65nm Tunneling Field Effect Transistor (TFET) 0.68 μm2 6T memory cell and multi-Vth device

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA STORAGE EQUIPMENT; LOGIC DESIGN; MICROPROCESSOR CHIPS; QUANTUM THEORY; THRESHOLD VOLTAGE;

EID: 33751413764     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDER.2005.1546613     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 2
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    • A lateral, unidirectional, bipolar-type insulated-gate transistor - A novel semiconductor device
    • March
    • Yasuhisa Omura. A lateral, unidirectional, bipolar-type insulated-gate transistor - a novel semiconductor device. Appl. Phys. Lett., 40(6):528-529, March 1982.
    • (1982) Appl. Phys. Lett. , vol.40 , Issue.6 , pp. 528-529
    • Omura, Y.1
  • 5
    • 21644455283 scopus 로고    scopus 로고
    • The tunneling field effect transistor (TFET) as an add-on for ultra-low-voltage analog and digital processes
    • Th. Nirschl et al. The tunneling field effect transistor (TFET) as an add-on for ultra-low-voltage analog and digital processes. In International Electron Device Meeting (IEDM), Technical Digest of, 2004.
    • (2004) International Electron Device Meeting (IEDM), Technical Digest of
    • Nirschl, Th.1
  • 6
    • 0042527899 scopus 로고    scopus 로고
    • Observation of source-to-drain direct tunneling current in 8 nm gate electrically variable shallow junction metal oxide semiconductor field effect transistors
    • June
    • Hisao Kawaura et al. Observation of source-to-drain direct tunneling current in 8 nm gate electrically variable shallow junction metal oxide semiconductor field effect transistors. Appl. Phys. Lett., 76(25):3810-3812, June 2000.
    • (2000) Appl. Phys. Lett. , vol.76 , Issue.25 , pp. 3810-3812
    • Kawaura, H.1
  • 7
    • 33751394049 scopus 로고    scopus 로고
    • ITRS Road-Map, http://public.itrs.net/, 2003.
    • (2003) ITRS Road-map
  • 8
    • 20344399069 scopus 로고    scopus 로고
    • The tunneling field effect transistor (TFET): The temperature dependence, the simulation model, and its application
    • Th. Nirschl et al. The tunneling field effect transistor (TFET): The temperature dependence, the simulation model, and its application. In International Symposium on Circuits and Systems (ISCAS), Proceedings of, 2004.
    • (2004) International Symposium on Circuits and Systems (ISCAS), Proceedings of
    • Nirschl, Th.1
  • 10
    • 33745154785 scopus 로고    scopus 로고
    • High performance and low power transistors integrated in 65nm Bulk CMOS technology
    • Z. Luo et al. High Performance and Low Power Transistors Integrated in 65nm Bulk CMOS Technology. In International Electron Device Meeting, Technical Digest of, 2004.
    • (2004) International Electron Device Meeting, Technical Digest of
    • Luo, Z.1
  • 11
    • 0000628423 scopus 로고    scopus 로고
    • Random modulation: Multi-threshold-voltage design methodology in sub-2-V power supply CMOS
    • Nov.
    • N. Kato, Y. Akita, M. Hiraki, T. Yamashita, T. Shimizu, F. Maki, and K. Yano. Random Modulation: Multi-Threshold-Voltage Design Methodology in Sub-2-V Power Supply CMOS. IEICE Trans. Electron., E83-C(11):1747-1754, Nov. 2000.
    • (2000) IEICE Trans. Electron. , vol.E83-C , Issue.11 , pp. 1747-1754
    • Kato, N.1    Akita, Y.2    Hiraki, M.3    Yamashita, T.4    Shimizu, T.5    Maki, F.6    Yano, K.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.