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Volumn 76, Issue 25, 2000, Pages 3810-3812

Observation of source-to-drain direct tunneling current in 8 nm gate electrically variable shallow junction metal-oxide-semiconductor field-effect transistors

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EID: 0042527899     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126789     Document Type: Article
Times cited : (97)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.