Visualization of grain subdivision by analysing the misorientations within a grain using electron backscatter diffraction

Journal of Microscopy

Volumn 218, Issue 2, 2005, Pages 104-114

  Van Boxel, Steven ^a   Seefeldt, M ^a   Verlinden, B ^a   Van Houtte, P ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

EBSD; Fragmentation; Grain subdivision; Misorientations

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION;

AVERAGE ORIENTATION; CONFIDENCE INDICES; DEFORMED GRAINS; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; FRAGMENTATION; GRAIN SUBDIVISION; GRAIN-BOUNDARY RECONSTRUCTION; MISORIENTATION ANGLE; MISORIENTATIONS;

GRAIN BOUNDARIES;

ACCURACY; ARTICLE; CALCULATION; COLOR; DATA ANALYSIS; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; GRAIN; IMAGE QUALITY; IMAGE RECONSTRUCTION; IMAGING SYSTEM; MEASUREMENT; PARAMETER; PRIORITY JOURNAL; STRUCTURE ANALYSIS; TECHNIQUE;

EID: 18444385681     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01467.x     Document Type: Article

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