Polarity determination for MOCVD growth of GaN on Si(111) by convergent beam electron diffraction

Materials Research Society Symposium - Proceedings

Volumn 595, Issue , 2000, Pages

  Zhao, L ^a   Marchand, H ^a   Fini, P ^a   Denbaars, S P ^a   Mishra, U K ^a   Speck, J S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33751345341     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)

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