Investigation of the high frequency properties of BST thin films - A comparison of three different commonly used methods

Integrated Ferroelectrics

Volumn 53, Issue , 2003, Pages 455-464

  Tappe, S ^a   Bottger U ^a   Waser, R ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

BST; CPW; Microstrip; Microwave measurement; Reflection; Resonator

Indexed keywords

ELECTRIC LOSS ANGLE MEASUREMENT; ELECTRIC PROPERTIES; MICROWAVE MEASUREMENT; PERMITTIVITY; REFLECTION; RESONATORS; SAPPHIRE; SUBSTRATES; WAVEGUIDES;

FREQUENCY RANGE; HIGH FREQUENCY PROPERTIES; LOSS FACTOR; MICROSTRIP;

FERROELECTRIC THIN FILMS;

EID: 33751305875     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580390258624     Document Type: Article

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