Characterization of ferroelectric BaSrTiO3 thin films using a flip-chip technique at microwave frequency ranges

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 5 A, 2000, Pages 2752-2755

  Sok, Junghyun ^a   Park, Sang Jin ^a   Lee Hong, Eun ^a   Hong, Jin Pyo ^b   Kwak, Jun Sik ^b   Kim, Chae O K ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

Dielectric loss; Ferroelectric thin films; Flip chip technique; SrRuO3 electrode

Indexed keywords

BARIUM TITANATE; CAPACITANCE; CERAMIC CAPACITORS; DEFECTS; ELECTRIC POTENTIAL; ELECTRODES; FERROELECTRIC MATERIALS; FLIP CHIP DEVICES; MICROWAVES; RESONATORS; THERMAL EFFECTS; THIN FILMS;

BARIUM STRONTIUM TITANATE;

DIELECTRIC FILMS;

EID: 0033702132     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.2752     Document Type: Article

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