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Volumn 11, Issue 1, 2000, Pages 38-44

Effective permittivity and attenuation coefficient of microstrip transmission line determined by 1-port and 2-port measuring methods

Author keywords

Dielectric constant; Microwave measurement; Microwave probing; Permittivity measurement

Indexed keywords

ALUMINA; CALIBRATION; DIGITAL SIGNAL PROCESSING; ELECTROMAGNETIC DISPERSION; ELECTROMAGNETIC WAVE ATTENUATION; MATHEMATICAL MODELS; MICROWAVE MEASUREMENT; MILLIMETER WAVES; PERMITTIVITY MEASUREMENT; SUBSTRATES;

EID: 0033691054     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/1/306     Document Type: Article
Times cited : (4)

References (15)
  • 4
    • 0006647391 scopus 로고
    • Microstrip effective dielectric constant measurement and test of CAD models up to 20 GHz
    • March
    • Medina J L, Serrano A and Mendieta F 1993 Microstrip effective dielectric constant measurement and test of CAD models up to 20 GHz Microw. J. March, 35 82-93
    • (1993) Microw. J. , vol.35 , pp. 82-93
    • Medina, J.L.1    Serrano, A.2    Mendieta, F.3
  • 6
    • 84928809109 scopus 로고
    • A dielectric resonator method of measuring inductive capacities in the millimetre range
    • July
    • Hakki B W and Coleman P O 1960 A dielectric resonator method of measuring inductive capacities in the millimetre range IEEE Trans. Microw. Theory Tech. July, 8 402-10
    • (1960) IEEE Trans. Microw. Theory Tech. , vol.8 , pp. 402-410
    • Hakki, B.W.1    Coleman, P.O.2
  • 9
    • 0038965661 scopus 로고
    • S-parameter design
    • April
    • Hewlett Packard 1972 S-parameter design Application Note 154 (April)
    • (1972) Application Note , vol.154
    • Packard, H.1
  • 13
    • 0020098937 scopus 로고
    • Accurate model for effective dielectric constant of microstrip with validity up to millimetre-wave frequencies
    • Kirschning M and Jansen R H 1982 Accurate model for effective dielectric constant of microstrip with validity up to millimetre-wave frequencies Electron. Lett. 18 272-3
    • (1982) Electron. Lett. , vol.18 , pp. 272-273
    • Kirschning, M.1    Jansen, R.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.