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Volumn 201, Issue 7 SPEC. ISS., 2006, Pages 3982-3986

Microstructure and physical properties of arc ion plated TiAlN/Cu thin film

Author keywords

Aluminum nitride; Cathadic Vacumm arc; Copper; Multilayer; Nano indention; Titanium

Indexed keywords

ELASTIC MODULI; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLOGRAPHIC MICROSTRUCTURE; MULTILAYERS; OXIDATION RESISTANCE; PHYSICAL PROPERTIES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33751278511     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2006.08.001     Document Type: Article
Times cited : (18)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.