|
Volumn 20, Issue 25-27, 2006, Pages 4655-4660
|
Characterization of ZnO films by ion beam analysis
|
Author keywords
Compositional analysis; Hall effect; IBA; RF magnetron sputtering; SEM; ZnO film
|
Indexed keywords
|
EID: 33751266539
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/s0217979206041847 Document Type: Conference Paper |
Times cited : (6)
|
References (17)
|