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Volumn 20, Issue 25-27, 2006, Pages 4655-4660

Characterization of ZnO films by ion beam analysis

Author keywords

Compositional analysis; Hall effect; IBA; RF magnetron sputtering; SEM; ZnO film

Indexed keywords


EID: 33751266539     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0217979206041847     Document Type: Conference Paper
Times cited : (6)

References (17)
  • 12
    • 1542693309 scopus 로고    scopus 로고
    • (CGS Computer Graphics Services, 52 Genung Circle, Ithaca NY)
    • RUMP User's Manual (CGS Computer Graphics Services, 52 Genung Circle, Ithaca NY).
    • RUMP User's Manual
  • 16
    • 0004077682 scopus 로고    scopus 로고
    • Report IPP 9/113 (Max-Planck-Institute fur Plasmaphysik, Garching, Germany)
    • M. Mayer, SIMNRA Users Guide, Report IPP 9/113 (Max-Planck-Institute fur Plasmaphysik, Garching, Germany, 1997).
    • (1997) SIMNRA Users Guide
    • Mayer, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.