Near-field reflection backscattering apertureless optical microscopy: Application to spectroscopy experiments on opaque samples, comparison between lock-in and digital photon counting detection techniques

Ultramicroscopy

Volumn 107, Issue 1, 2007, Pages 16-24

  Diziain, S ^a   Bijeon, J L ^a   Adam, P M ^a   Lamy de la Chapelle, M ^a   Thomas, B ^a   Deturche R ^a   Royer, P ^a  

^a CNRS FRE 2848   (France)

Author keywords

Fluorescence spectroscopy; Near field scanning optical microscopy; Rayleigh scattering

Indexed keywords

BACKSCATTERING; FLUORESCENCE; LATEXES; MICROSCOPES; RAYLEIGH SCATTERING; REFLECTION; SPECTROSCOPIC ANALYSIS;

APERTURELESS SCANNING NEAR FIELD OPTICAL MICROSCOPE (ASNOM); CONFOCAL MICROSCOPES; DIGITAL PHOTON COUNTING DETECTION; FLUORESCENCE SPECTROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPARATIVE STUDY; CONFOCAL MICROSCOPY; FLUORESCENCE SPECTROSCOPY; LIGHT SCATTERING; MATHEMATICAL ANALYSIS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL NOISE RATIO;

EID: 33751255419     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.04.009     Document Type: Article

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