Dependence of FinFET RF performance on fin width

2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Digest of Papers

Volumn 2006, Issue , 2006, Pages 8-11

  Lederer, D ^a   Parvais, B ^b   Mercha, A ^b   Collaert, N ^b   Jurczak, M ^b   Raskin, J P ^a   Decoutere, S ^b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b IMLC   (Belgium)

Author keywords

Cut off frequency; FinFET; Metal gate; RF analysis; Small signal model

Indexed keywords

COMPUTATIONAL GEOMETRY; ELECTRIC RESISTANCE; IDENTIFICATION (CONTROL SYSTEMS); NATURAL FREQUENCIES; OPTIMIZATION;

CUT OFF FREQUENCY; FINFET; METAL GATES; RF ANALYSIS; SMALL SIGNAL MODEL;

FIELD EFFECT TRANSISTORS;

EID: 33751214764     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMIC.2005.1587887     Document Type: Conference Paper

References (8)

1. t asymmetric-gate FinFET devices", Proceedings of IEDM, pp. 437-440, December 2001.
2. D. Woo et al., "Electrical characteristics of FinFET with vertically nonuniform source/drain profile", IEEE Trans Nanotech, vol. 1, no. 4, pp. 233-237, December 2002.
3. V. Kilchytska et al., "Perspective of FinFETs for analog applications", Proceedings of ESSDERC04, pp. 65-68, September 2004.
4. D. Lederer et al.,"FinFet analogue characterization from DC to 110 GHz", Sol. St. Electron., vol. 49, pp. 1488-1496, October 2005.
5. A. Dixit et al., "Analysis of the parasitic source/drain resistance in multiple gate field effect transistors", IEEE Trans. Electron Dev., vol. 52, no. 6, pp. 1131-1140, 2005.
6. J.P. Raskin et al., "Accurate MOSFET characterization at microwaver frequencies for device optimization and analog modeling", IEEE Trans. Electron Dev., vol. 45, pp. 1017-1025, May 1998.
7. A. Bracale et al., "A new approach for SOI device small-signal parameter extraction", Analog Integr. Circuits Signal Process., vol. 25, pp. 159-167, 2000.
8. G. Dambrine et al., "What are the limiting parameters of deep submicron MOSFETs for high frequency applications?", IEEE Electron Dev. Lett., vol. 24, no. 3, pp. 189-191, March 2003.