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Volumn 569, Issue 1, 2006, Pages 132-135
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Sensor simulation and position calibration for the CMS pixel detector
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Author keywords
Charge collection; CMS; Electric field; Pixel; Radiation hardness; Silicon
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Indexed keywords
CHARGE CARRIERS;
COMPUTER SIMULATION;
ELECTRIC FIELD EFFECTS;
IMAGE SENSORS;
RADIATION DAMAGE;
RADIATION DETECTORS;
CHARGE COLLECTION;
CMS;
PIXEL;
RADIATION HARDNESS;
SILICON SENSORS;
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EID: 33751171257
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2006.09.024 Document Type: Article |
Times cited : (1)
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References (11)
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